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Dr. Faisal Khan Gives SLC Industry Seminar on Friday, January 26th

Dr. Faisal Khan from the University of Missouri will present the SLC Industry seminar on Friday, January 26, 2018 in MHK Room 124 from 12:20 pm to 1:10 pm. His talk is titled "Degradation monitoring and failure analysis of high-power semiconductor devices using Spread Spectrum Time Domain Reflectometry."

Presenter: Dr. Faisal Khan, University of Missouri

Title: Degradation monitoring and failure analysis of high-power semiconductor devices using Spread Spectrum Time Domain Reflectometry

Where: MHK 124, plus WebEx (see bottom of page) and Live Recording (watch)

Time: Friday, January 26, 12:20 PM - 1:10 PM EST

Abstract: Power electronic devices and circuit undergo natural fatigue and degradation especially when they are used in high power applications. High-power converters are key elements of power utility systems, industrial systems, large vehicles, and many other high power applications.   Little or no down time, particularly no unexpected down time, can be tolerated in these critical applications, as they support essential life systems for homes, businesses, transportation, and more, so multiply redundant systems are commonly used.  The outcome of this research aims to determine the natural degradation associated to various components in a live power converter using spread spectrum time domain reflectometry (SSTDR). Using SSTDR, it is possible to locate the origin of an aged device and its associated degradation level in a complex power converter circuit. This project will develop a novel method which will allow us to predict failures before they happen, tracking the state of health (SOH) and remaining life of live power converters. The solution obtained through this research will be extremely beneficial for high-power applications where uninterrupted operation is critical but redundancy is not cost effective -- automotive, utility applications, industrial motor drives are a few examples of these applications. The proposed concept will be able to track the age-induced impedance changes in all parts of the power converter circuit, as well as its interconnections, in real time, with great precision and spatial resolution. Using individual degradation levels, we propose a novel method to determine the overall remaining life of the converter. 

Bio: Dr. Faisal Khan received his B.Sc, MS and Ph.D degrees from Bangladesh University of Engineering and Technology, Arizona State University, and University of Tennessee, Knoxville in 1999, 2003 and 2007 respectively – all in electrical engineering. From 2007-2009, Dr. Khan has been with Electric Power Research Institute (EPRI) as a Senior Power Electronics Engineer. From 2009 to 2014, he was with the Electrical and Computer Engineering Department of University of Utah as an Assistant Professor. Since 2015, he is with University of Missouri, Kansas City as an Associate Professor. His major area of interest is designing power converters for emerging applications and characterizing degradation/aging in power converters and components using spread spectrum time domain reflectometry. Professor Khan is a senior member of IEEE and an Associate Editor of IEEE Transactions on Power Electronics. 

Click here to go to seminar page.

Watch the seminar 

WebEx Information

Speaker: Dr. Faisal Khan, University of Missouri

Date: Friday, January 26, 2018 

Time: 12:20 pm - 1:10 pm, Eastern Daylight Time (New York, GMT-04:00) 

Meeting Number: 624 987 217  

Meeting Password: power 

Click here to join. If requested, enter your name and email address.
If a password is required, enter the meeting password: power 
To join the audio conference only - 1-877-668-4493

Call-in toll number (US/Canada): 1-650-479-3208 

Access Code - 624 987 217